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Automatic Surface Crack and Other Defects Detection System for Ball Head Pins

Automatic Surface Crack and Other Defects Detection System for Ball Head Pins

2025-05-29

Detection Host: FET Two-Channel 99S Intelligent Digital Eddy Current Flaw Detector

System Detection Process: Automatic feeding, automatic detection, automatic sorting

Detection Objects: Surface cracks and other surface defects (pitting, chipping) on ball head pins, as well as the presence of holes

Detection Speed: 1,440 pieces/hour (dual-station detection)

Ball Head Pin:

latest company case about Automatic Surface Crack and Other Defects Detection System for Ball Head Pins 0

Detection by the Automatic Surface Crack and Other Defects Detection System for Ball Head Pins:

latest company case about Automatic Surface Crack and Other Defects Detection System for Ball Head Pins 1